2020年7月30日布鲁克推出了ZUI新一代  速原子力显微镜NanoRacer®。NanoRacer®凭借其50帧/秒的  速成像，实现了真正意义上视频级成像速度下单个生物分子的动态观察。NanoRacer®的革新性的技术突破，在AFM发展  树立了新的里程碑。布鲁克BioAFM研发团队与生命科学领域的专家紧密合作，使NanoRacer®不仅拥有  扫描速率与原子级别分辨率，而且拥有杰出的易用性，使得对单分子动态过程的捕捉变得十分便捷，为深入理解生物物理、生物化学、分子生物学、病毒学以及生物医学等领域的单分子动态过程提供了强大工具。
 
全新的NanoRacer®采用了新的架构结合 低噪音、  稳定性的Vortis™ 2控制器，全新的驱动算法与力控制算法，可以在  速下获取高分辨的生物样品信息。新系统整合了基于工作流程的V7操作软件，直观的用户界面与流程化、自动化的设置使得研究人员可以专注于自己的实验，加速  研究的产出能效。
 
Specifications
 
Maximum scan speed of up to  50 frames/sec with 100 ×100 nm2 scan range and 10 k pixels
 
 
 
Atomic defect resolution in  closed-loop
 
 
Designed for medium to small sized cantilevers for lowest forces and highest scan speeds
 
 
Ultra-low noise cantilever-deflection detection system
 
 
IR cantilever-deflection detection light  source with small spot size
 
 
Optional photothermal cantilever drive. 730 nm wavelength ensures minimal sample interaction compared to blue-light excitation
 
 
Highest detector bandwidth of  8 MHz for high speed signal capture
 
 
Automated laser and detector   alignment
 
 
Scanner unit
 
  
 
   
2 × 2 × 1.5 μm3 scan range
 
   
Sensor noise level < 0.09 nm RMS in xy
 
   
0.04 nm RMS sensor noise level in z
 
   
Highest resonance frequency for z axis of >180 kHz
 
   
Typical sample size 4 mm diameter
 
  
 
 
Control electronics
 
 
 
Vortis 2 Speed controller: State-of-the-art, digital controller  with lowest noise levels and  highest flexibility
 
 
Newly designed, high-voltage power amplifier drives the scanner unit
 
 
New workflow-based V7 SPMControl software
 
 
 
True multi-user platform, ideal for imaging facilities
 
 
User-programmable software
 
 
AutoAlignment and setup
 
 
Advanced feedback algorithms
 
 
Fully automated sensitivity and spring constant calibration using thermal noise or Sader method
 
 
Improved ForceWatch™ and  TipSaver™ mode for force spectroscopy and imaging
 
 
Advanced spectroscopy modes,
 
 
Powerful Data Processing (DP) with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section, etc.
 
 
Powerful batch processing of force curves and images, including WLC, FJC, step-fitting, JKR, DMT model and other analyses