Chroma/致茂台湾58212-CTester Mode特色：
 
 
 
High speed and accuracy
 
 
Lateral, vertical, and flip chip
 
 
Wide power test range (up to 200V/2A)
 
 
Up to 8 inch wafers
 
 
Chroma® Huge Photo Detector
 
 
Unique edge sensor
 
 
Patented probe head
 
 
Robust Z-Axis stage
 
 
Wafer mapping algorithm
 
 
External light shielding enclosure
 
 
Analysis tools and statistical reports
 
 
Test Items
 
 
 
Electrical parameters: 
- Forward Voltage Measurement (Vf ) 
- Reverse Breakdown Voltage Measurement (Vrb) 
- Reverse Leakage Current (Ir) 
- SCR detection
 
 
Optical parameters: 
- Optical power (mw, lm, mcd) 
- Dominant Wavelength (Wd) 
- Peak Wavelength (Wp) 
- Full Width at Half Maximum (FWHM) 
- CIExy - CCT - CRI
 
 

 
 
 
The Chroma 58212-C features an automated LED wafer/chip probe tester, delivering fast and accurate LED measurements with test times less than 125ms *1.
 
The system can be modified to support different LED structures including Lateral, Vertical,.
 
Chroma's unique design acquires and analyzes optical data such as the dominant wave length, peak wavelength,, it provides essential electrical data such as forward voltage, leakage current, and rever    reakdown voltage, all in one test step.
 
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Note *1 : Test condition: under 300um sample pitch,, the measurement results may vary.
 
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ModelDescription询价58212-CLED Mapping Probe Tester